ESDEMCThe model ES612 ESD Tester is a 2 Pin tester designed for the evaluation of devices at both wafer level and package level. The tester is designed to carry HBM, HMM and MM ESD standards. Determination of ESD failure thresholds is made easy using one of the external DC characterization measurement capabilities. The unit can be expanded with our automatic multi-pin device tester and be used as part of your device qualification process.
The pulse source design and pulse source delivery method ensure waveform performance directly at the device under test. Current waveforms can be automatically captured and analyzed for each ESD event. In addition, voltage waveforms can be captured and used to determine the turn-on level of protection circuit. They can also be used as a means of failure determination, as the DC characterizations show changes after ESD events.
The pulse source design and pulse source delivery method ensure waveform performance directly at the device under test. Current waveforms can be automatically captured and analyzed for each ESD event. In addition, voltage waveforms can be captured and used to determine the turn-on level of protection circuit. They can also be used as a means of failure determination, as the DC characterizations show changes after ESD events.
| Parameters | ES612-2K | ES612-8K | ES612-12K | ES612-20K | Unit |
| Output Voltage | ± 10 ~ 2000 | ± 10 ~ 8000 | ± 10 ~ 12000 | ± 10 ~ 20000 | V |
| Output Voltage Step | 1V up to 500V, 10V up to 2 kV |
1V up to 500V, 10V up to 8 kV |
1V up to 500V, 10V up to 12 kV |
1V up to 500V, 10V up to 20 kV |
V, kV |
| Output Voltage Precision | Better than ± 1 % ± 5 V | % | |||
| Dimensions | 347 X 300 X 145 | mm | |||
| Weight | 5 | 6 | 6 | 7 | kg |
| V and I Measurement | Passive voltage and current probes | ||||
| Supported Oscilloscopes | Majority models from Keysight, Tektronix, LeCroy. | ||||
| Supported SMU | Keithley 24xx/26xx series SMU. | ||||
特點
Low Parasitic HBM/HMM/MM tester with high quality pulses
Low Parasitic HBM/HMM/MM tester with high quality pulses
Friendly for probe station
Large Touch Panel and Firmware Upgradable
Optional Software Controlled Automated Pulse and Failure Measurement
Optional Pulsed IV and DC IV Characterization
General device level ESD test for wafer, packaged, PCB and system devices
HBM module meets ANSI/ESDA/JEDEC JS-001-2017
HMM module meets ANSI/ESD SP5.6-2009, 50 Ohm Method
MM module meets ANSI/ESD STM5.2-2019
HBM module meets ANSI/ESDA/JEDEC JS-001-2017
HMM module meets ANSI/ESD SP5.6-2009, 50 Ohm Method
MM module meets ANSI/ESD STM5.2-2019